InGaAs陷探测器:以1%的不确定性向短波红外标准迈进
Applied optics
|August 12, 2025
概括
我们开发了一种具有成本效益的甲 (InGaAs) 陷探测器,用于短波红外 (SWIR) 测量. 这种探测器提供了高效率和稳定性,作为一种实用的替代方案,昂贵的冷放射测量用于光二极管校准.
科学领域:
- 放射测量是一种放射测量.
- 光学计量学 在光学计量学
- 半导体设备物理 半导体设备物理
背景情况:
- 和光二极管是可见光和近红外光 (NIR) 的常用标准.
- 甲 (InGaAs) 光二极管为短波红外 (SWIR) 检测 (1-1.65μm) 提供了卓越的性能.
- 现有的SWIR标准通常依赖于昂贵而复杂的冷放射测量.
研究的目的:
- 开发和评估用于SWIR放射测量的基于InGaAs的紧型陷探测器.
- 评估探测器的性能作为SWIR测量的潜在标准.
- 为光电二极管校准提供低成本有效的替代冷放射测量方法.
主要方法:
- 设计了一个小尺寸的光学陷,使用了两种现成的InGaAs光二极管和一个高反射率镜.
- 评估了原型陷探测器的稳定性,偏振依赖性和响应性.
- 通过SWIR波长测量系统检测效率.
主要成果:
- 在1至1.3微米的波长中,系统检测效率超过98%的效率.
- 显示出出色的稳定性和低极化依赖性.
- 陷探测器具有作为主要标准的潜力,在SWIR检测中具有1%的不确定性.
结论:
- 开发的InGaAs陷探测器是SWIR测量的一种稳定,耐用和多功能工具.
- 它提供了一个实用且具有成本效益的替代品,用于冷放射测量,不确定性为1%.
- 这种探测器可以减少对SWIR范围内的光二极管校准复杂系统的依赖.
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