概括
本研究引入了一种用于多层样本的光学连贯性断层扫描 (OCT) 的新型人工物去除方法. 该技术通过抑制图像工件来增强液晶显示器 (LCD) 面板的缺陷检测.
科学领域:
- 光学工程是指光学工程.
- 计量学 计量学 计量学
- 材料科学 材料科学 材料科学
背景情况:
- 液晶显示屏 (LCD) 面板的缺陷检测对于质量控制至关重要.
- 光学连贯断层扫描 (OCT) 是一种用于显示面板检查的高分辨率成像技术.
- 在多层样本的OCT成像中存在的缺陷,阻碍了准确的缺陷检测.
研究的目的:
- 提出和验证一种新的方法,用于在多层折射样品的连贯成像中去除工件.
- 使用OCT提高LCD面板缺陷检测的可靠性.
主要方法:
- 使用了两个直角偏振的参考束,具有固定相位移,以抑制自相对应器件.
- 开发了一种算法,与可调节的参考光束强度比相结合,以区分真实信号和镜像工件.
- 实现了多层样本的全范围成像.
主要成果:
- 在多层样本中成功抑制了由自我干扰和多重反射产生的复杂的自相关元件.
- 展示了区分真实信号与镜像文物的能力,使全程成像成为可能.
- 通过对石英玻璃,3D成像,陶块和液晶面板的3D成像来验证方法.
结论:
- 拟议的文物去除方法显著提高了OCT检查多层结构的可靠性.
- 这种技术为液晶面板的缺陷检测提供了优势,提高了质量控制流程.
- 经过验证的方法为克服多层折射样本成像挑战提供了强大的解决方案.
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