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相关概念视频

Attenuated Total Reflectance (ATR) Infrared Spectroscopy: Overview01:13

Attenuated Total Reflectance (ATR) Infrared Spectroscopy: Overview

555
Attenuated total reflectance (ATR) infrared spectroscopy is a powerful analytical technique used to study the composition of materials. It is widely employed in chemistry, materials science, forensic science, and other fields where sample characterization is required. ATR has several advantages over traditional transmission IR spectroscopy, including the requirement of little to no sample preparation and the ability to analyze a wide range of samples.
The ATR process begins by directing a beam...
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Simulation, Fabrication and Characterization of THz Metamaterial Absorbers
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精确的厚度测量方法用于厚材料中的薄层,使用太赫兹技术.

Sen-Cheng Zhong, Liang-Hui Du, Hu-Gui Jin

    Optics express
    |August 13, 2025
    PubMed
    概括

    我们开发了两种新的太赫兹时域光谱 (TDS) 配套方法,以精确测量厚材料中的薄层. 这些方法显著提高了分辨率,用于分层材料的表征.

    科学领域:

    • 物理 物理学 物理
    • 材料科学 材料科学 材料科学
    • 频谱学是一种光谱学.

    背景情况:

    • 太赫兹时域光谱 (TDS) 面临着在厚厚材料内分辨薄层的挑战.
    • 精确的厚度测量对于表征分层材料至关重要.

    研究的目的:

    • 引入和验证两种新的时间域合适方法,用于通过TDS在厚材料中增强薄层厚度检测.
    • 为了克服现有的TDS厚度测量技术的分辨率限制.

    主要方法:

    • 开发一种基于参考信号的实验方法 (TDF-ER),用于准确的TDS测量.
    • 开发一种基于基准信号的模拟方法 (TDF-SR) 用于在实验参考无法使用的情况下.
    • 在各种材料样本上对TDF-ER和TDF-SR方法进行模拟和实验验证.

    主要成果:

    • 通过TDF-ER方法,可以对金属基板进行精确的表面涂层测量,检测到4μm的厚度,偏差小于10%.
    • 通过TDF-SR方法,在不同厚度 (20-40毫米) 的聚合物结合爆炸物 (PBX) 样本中成功识别了260微米和610微米的层厚.
    • 使用TDF-ER方法准确测量了50毫米厚的PBX样本中的层厚度.

    结论:

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    • 拟议的TDF-ER和TDF-SR方法显著提高了厚材料中薄层厚度测量的分辨率.
    • 这些方法为使用TDS技术详细表征分层材料提供了实际解决方案.