构建稳定的Li6.4La3Zr1.4Ta0.6O12,通过Li4(BH4)3I/BN的缓冲层构建稳定的Li接口,具有高离子导电性和临界电流密度
Jinhu Wang1, Ziqiang Wu1, Kaiwen Wang2
1S2e and Engineering, Jiangsu Key Laboratory of Advanced Metallic Materials Southeast University, Nanjing, 211189, P. R. China.
Small (Weinheim an der Bergstrasse, Germany)
|August 13, 2025
概括
一个新的复合材料缓冲层,Li4(BH4)3I/2(d-BN) (LBHIbn),显著降低了接口阻抗,并抑制了Li6.4La3Zr1.4Ta0.6O12固体电解质中的树突. 这一突破提高了全固态电池的性能和安全性.
科学领域:
- 材料科学 材料科学 材料科学
- 电化学 电化学 电化学
- 固态电池 固态电池是什么
背景情况:
- 由于其高离子导电性和安全性,Li6.4La3Zr1.4Ta0.6O12 (LLZTO) 是所有固态电池的有前途的固体电解质.
- 对于LLZTO的关键挑战包括高接口阻抗与金属阳极和树形成,阻碍实际应用.
- 现有的缓冲层往往具有有限的离子导电性或无法有效地抑制树突.
研究的目的:
- 开发一种新的缓冲层,以减轻LLZTO和金属之间的接口问题.
- 为了提高在LLZTOdSiLi接口的离子导电性和临界电流密度.
- 为了提高基于LLZTO的全固态电池的稳定性和安全性.
主要方法:
- 一个复合缓冲层,Li4(BH4)3I/2(d-BN) (LBHIbn),被合成并引入到LLZTO धूपLi接口.
- 进行了理论计算,以评估LBHIbn和金属之间的接口能量.
- 电化学阻抗光谱学和静电循环被用来评估接口阻抗,临界电流密度和涂/剥离稳定性.
主要成果:
- 与LiBH4 (0.434 J m-2) 相比,LBHbn层表现出较低的接口能量 (0.366 J m-2) 与金属.
- 在30°C时,LLZTO,LBHIbn,Li系统的接口阻抗降低到4 Ω cm-2.
- 临界电流密度从0.93 mA cm-2增加到5.29 mA cm-2,在1000小时内循环稳定.
- LBHIbn表现出高离子导电性 (4.0 × 10-4 S cm-1) 和电子绝缘性 (1.9 × 10-9 S cm-1),有效抑制了树突.
结论:
- LBHIbn复合材料缓冲层有效地解决了LLZTO固体电解质的界面挑战.
- 这种接口工程策略显著提高了金属阳极的性能和树突抑制能力.
- 这些发现为LLZTO和类似的化物/氧化物电解质在先进的全固态电池中的更广泛应用铺平了道路.
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