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相关概念视频

Phase Contrast and Differential Interference Contrast Microscopy01:26

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交叉双微分散干涉测量,范围范围范围.

Yang Wang1,2, Jindong Wang3, Jingsheng Huang4

  • 1State Key Laboratory of Ultrafast Optical Science and Technology, Xi'an Institute of Optics and Precision Mechanics, Chinese Academy of Sciences, Xi'an 710119, China.

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概括
此摘要是机器生成的。

这项研究引入了一种新的交叉双微测距方法. 它消除了异步测量误差,并扩大了高精度距离测量的非模两可范围.

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科学领域:

  • 光学和光子学 在光学和光子学.
  • 计量学 计量学 计量学
  • 激光物理 激光物理

背景情况:

  • 索利顿微是用于高精度测距的先进激光源.
  • 高重复率虽然有利,但限制了非模两可的范围 (NAR).
  • 现有的双方法扩展了NAR,但引入了异步测量误差 (AME),降低了准确性.

研究的目的:

  • 提出一个交叉双微绝对范围方案.
  • 在动态测量中消除AME.
  • 扩展NAR以实现高精度,长距离的射程.

主要方法:

  • 使用分散干扰计方法.
  • 实现一个交叉双微配置.
  • 使用一次性光谱采样来消除AME.

主要成果:

  • 在动态测量过程中实现了AME的完全消除.
  • 通过Vernier效应将NAR从3毫米延长到339米.
  • 经过56秒的平均计算后,证明的艾伦偏差降至5.63纳米.

结论:

  • 拟议的方案有效地消除了AME,并大大扩大了NAR.
  • 该方法显示了直接集成芯片和最小检测器需求的潜力.
  • 为未来的高精度,远距离射程和小型化激光雷达系统提供了先进的方法.