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Updated: May 3, 2026

Characterization of Surface Modifications by White Light Interferometry: Applications in Ion Sputtering, Laser Ablation, and Tribology Experiments
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Characterization of Surface Modifications by White Light Interferometry: Applications in Ion Sputtering, Laser Ablation, and Tribology Experiments

Published on: February 27, 2013

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在不平衡的表面生长过程中最大限度地降低内在粗度.

Pablo M Amorim1, Edwin E Mozo Luis2, Fernando F Dall'Agnol3

  • 1Universidade Federal da Bahia, Instituto de Física, Campus Universitário da Federação, Rua Barão de Jeremoabo s/n, 40170-115 Salvador, Bahia, Brazil.

Physical review. E
|August 19, 2025
PubMed
概括

转换平均高度配置 (TMHP) 技术有效地将随机表面的内在粗度降到最低. 这种方法可以更准确地描述全球和本地粗度,解决表面增长分析中的问题.

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