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通过冷X射线光电子光谱测试金属电池的固体电解质相间形成和动态

Shenghong Wang¹, Shiwen Li^1,2, Xiaoqin Chen¹

¹State Key Laboratory of Catalysis, Dalian Institute of Chemical Physics, Chinese Academy of Sciences, Dalian 116023, China.

Journal of the American Chemical Society

|August 20, 2025

概括

用气集束离子束 (GCIB) 喷射的冷X射线光电子光谱学 (cryo-XPS) 在电解质条件下揭示了电池中固体电解质介面 (SEI) 的真实组成,揭示了其分级结构和动态演变.

科学领域:

材料科学
电化学
表面科学

背景情况:

固体电解质介面 (SEI) 对于电池的性能至关重要.
由于当前深度分析技术的局限性,在电解质条件下理解本土SEI具有挑战性.
现有的方法往往会改变SEI的组成,阻碍准确的分析.

研究的目的:

开发和应用一种新的技术来分析本地湿SEI,而不会造成化学损害.
揭示金属电池中SEI的详细组成和架构.
调查沉积过程中SEI的动态演变.

主要方法:

结合气集束离子束 (GCIB) 喷射的冷却式X射线光电子光谱 (cryo-XPS) 平台的开发.
在电解质条件下对玻璃化湿SEI样本进行深度分析.
分析SEI的组成,包括有机和无机物种,以及其空间分布.

主要成果:

混合冷-XPS/GCIB方法成功捕获了原生湿SEI的全部组成,包括有机聚合物碳化合物和无机物种 (LiC_x,LiF,LiO_x,Li₂CO₃).
一个分级的SEI架构被确定,在电解质接口上有电化学产品 (LiF,Li₂CO₃),在电极接口上有化学产品 (LiO_x,LiC_x).
该研究观察到沉积过程中SEI的组成变化和厚度增加 (nm到μm),表明了动态演变.

结论:

具有GCIB喷雾的深度分辨率的冷XPS是一种强大的工具,可以在没有化学改变的情况下表征本地湿SEI.
这种技术为SEI的复杂,分级架构和动态性提供了前所未有的洞察力.
该方法对研究储能和电催化中的固体-液体接口具有前景.

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