Mingu Kang1,2, Eun Sook Lee3, Eun Seong Lee1

  • 1Material Property Metrology Group, Korea Research Institute of Standards and Science (KRISS), Daejeon, 34113, Republic of Korea.

Small methods
|August 21, 2025
PubMed
概括

这项研究使用光诱导力显微镜 (PiFM) 介绍了单个外体的纳米级表观遗传特征. 这种方法可以根据表观遗传标记区分结直肠癌外体,为改善癌症诊断铺平道路.