0.91 V 参考值,3.3 ppm/°C 亚BGR 具有二级补偿和改善的 PSRR
Chokkakula Ganesh1, Satheesh Kumar S2, A Shanthi3
1Deptartment of Electronics and Communication Engineering, VNR Vignana Jyothi Institute of Engineering and Technology, Hyderabad, India.
Scientific reports
|August 23, 2025
概括
这项研究提出了一种新的带隙参考 (BGR) 电路,提供卓越的温度稳定性和工艺变化耐受性. 优化的设计可以实现显著降低温度系数和改善模拟应用的电源排斥比率.
科学领域:
- 电气工程
- 模拟集成电路设计
背景情况:
- 带隙参考 (BGR) 电路对于稳定的电压产生至关重要.
- 传统的BGR设计面临着温度稳定性和工艺变化的挑战.
- 高精度应用需要改进性能指标,如温度系数和PSRR.
研究的目的:
- 设计和分析一个新的BGR电路.
- 增强温度稳定性并最大限度地减少工艺变化的影响.
- 与现有的BGR拓相比,实现更高的性能.
主要方法:
- 实施二级补偿技术
- 一个优化的误差放大器和一个低温度系数电阻网络的设计.
- 在PVT变化下开发可靠的启动机制.
- 与传统的CM-BGR,级联CM-BGR,基于Op-Amp的BGR和Sub-BGR进行模拟和比较.
主要成果:
- 达到了3.33ppm/°C的温度系数 (58.97-78.79%的降低).
- 在电源拒绝比率 (PSRR) 中得到了1.12×-6.02×的改进.
- 显示了96%的改进线路调节与723μV的变化.
- 在基于Op-Amp的BGR和Sub-BGR技术上验证了优异的性能.
结论:
- 拟议的BGR电路在温度稳定性和工艺变化耐受性方面提供了显著的改进.
- 增强的性能使得BGR非常适合高精度模拟和混合信号应用.
- 使用32nmCMOS技术模拟的设计,代表了BGR电路设计的显著进步.
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