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Updated: Sep 10, 2025

Microscopic Visualization of Porous Nanographenes Synthesized through a Combination of Solution and On-Surface Chemistry
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基于AFM,SEM和LP-N2GA的不同级别的煤的表面纳米孔形态的自动识别和量化

Dun Wu1,2, Jianghao Wei1, Shoule Zhao1

  • 1Key Laboratory of Intelligent Underground Detection Technology, College of Civil Engineering, Anhui Jianzhu University, Hefei, China.

Journal of microscopy
|August 26, 2025
PubMed
概括

煤层显著改变孔隙结构,影响气体吸附和储存. 增加煤炭等级可以改善孔隙形态,增加孔隙性,并提高甲开发和碳封存的适用性.

关键词:
飞行员管理没有SEM微纳米孔隙结构孔隙互补性各种普通煤

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Atomic Force Microscopy01:08

Atomic Force Microscopy

Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
The AFM Probe
The probe is regarded as the heart of any AFM setup and comprises the...
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