WTCN-Informer:使寿

Tingyu Ma1, Jiaqi Liu1, Panfeng Xu1

  • 1School of Physics, Liaoning University, Chongshan Campus, Shenyang 110031, China.

PubMed
概括

对半导体制造来说,预测制冷系统的剩余使用寿命至关重要. 拟议的FECAM-WTCN-Informer模型显著提高了预测性维护的RUL预测精度.