基于一组与SER相关的配置参数的一般SER率预测模型的研究
Shougang Du1, Shulong Wang2, Shupeng Chen2
1China Academy of Space Technology, Beijing 100086, China.
Micromachines
|August 28, 2025
概括
这项研究通过考虑粒子能量和类型的新方程式来提高辐射效应的预测. 这些进步提高了集成电路单事件效应率预测的准确性.
科学领域:
- 辐射的影响
- 集成电路的可靠性
- 核工程
背景情况:
- 传统的辐射效应预测模型,如RPP和IRPP,都有其局限性.
- 现有的模型经常忽略在SEU截面计算中的粒子能量和类型等关键因素.
- 集成电路技术的进步需要更精确的辐射效应评估方法.
研究的目的:
- 分析辐射效应预测模型的新发展和挑战.
- 解决目前预测单一事件效应 (SEE) 的模型的局限性.
- 导出包含粒子特征和相互作用体积的SEE速率的一般估计方程.
主要方法:
- 对现有预测模型 (RPP,扩展RPP,IRPP) 的全面分析.
- 基于概率特征的一般SEE速率估计方程的推导.
- 使用交互体积扩展敏感体积概念.
- 在SEE率截面和预测面积之间的关系的推导.
主要成果:
- 开发了考虑粒子能量和类型的SEE速率的一般估计方程.
- 推导出适用于工程应用的简化SEU速率预测方程.
- 使用一般预测方程建立估计辐射干扰性能的方法.
- 在两个典型的验证回路上验证了方法.
结论:
- 在先进的集成电路中,新的预测方程可以提高辐射效应的准确性.
- 考虑粒子能量,类型和相互作用体积对于可靠的SEE速率预测至关重要.
- 该方法为辐射硬化中的工程应用提供了实用工具.
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