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Updated: May 7, 2026

Comprehensive Characterization of Extended Defects in Semiconductor Materials by a Scanning Electron Microscope
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SCP-DETR:用于PCB缺陷检测的高效小物体增强特征金字塔方法

Yuanyuan Wang1, Tongtong Yin1, Xiuchuan Chen1

  • 1College of Computer and Software Engineering, Huaiyin Institute of Technology, Huaian, China.

PloS one
|August 29, 2025
PubMed
概括

这项研究引入了SCP-DETR,一种用于检测印刷电路板 (PCB) 的小缺陷的改进方法. SCP-DETR通过优化功能融合和使用专用卷曲来提高准确性,显著提高了缺陷检测性能.

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相关概念视频

Effects of EDTA on End-Point Detection Methods01:18

Effects of EDTA on End-Point Detection Methods

Different methods, such as visual observance of metal-ion indicators, spectroscopic techniques, and potentiometric methods, can determine the endpoint of an EDTA titration.
In the visual method, metal-ion indicators (metallochromic dyes), which have distinct colors in their free and complex forms, are added to the mixture to signal the titration's end point. They form stable complexes with metal ions, but these complexes are weaker than the corresponding metal–EDTA complexes. As a...
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