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Updated: Sep 9, 2025

Atomic Force Microscopy Cantilever-Based Nanoindentation: Mechanical Property Measurements at the Nanoscale in Air and Fluid
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Atomic Force Microscopy Cantilever-Based Nanoindentation: Mechanical Property Measurements at the Nanoscale in Air and Fluid

Published on: December 2, 2022

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用原子力显微镜绘制纳米机械性质的进展

Ricardo Garcia1, Jaime R Tejedor1

  • 1Instituto de Ciencia de Materiales de Madrid, CSIC c/ Sor Juana Inés de la Cruz 3 28049 Madrid Spain r.garcia@csic.es.

Nanoscale advances
|August 29, 2025
PubMed
概括

原子力显微镜 (AFM) 的缩影模式映射出纳米尺度的机械特性. 这篇评论更新了自2019年以来的准确性,速度,机器学习和纳米机械断层扫描等先进应用方面的进展.

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相关概念视频

Atomic Force Microscopy01:08

Atomic Force Microscopy

Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
The AFM Probe
The probe is regarded as the heart of any AFM setup and comprises the...
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