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使用内置自测的增强测试策略的模拟数字转换器的设计和测试

Ramesh J1, Govindaraj V2, Sharmila Devi S3

  • 1Department of Electronics and Communication Engineering, PSG College of Technology, Coimbatore, India.

Scientific reports
|August 29, 2025
PubMed
概括

一个新的内置自测 (BIST) 方案有效地检测模拟数字转换器 (ADC) 的故障. 这种方法在各种ADC架构中实现了高故障覆盖率,提高了复杂的混合信号集成电路的可靠性.

关键词:
进行ADC测试在自测中构建缺陷覆盖范围缺陷建模

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