相关实验视频

Updated: Jun 24, 2026

Ohmic Contact Fabrication Using a Focused-ion Beam Technique and Electrical Characterization for Layer Semiconductor Nanostructures
08:12

Ohmic Contact Fabrication Using a Focused-ion Beam Technique and Electrical Characterization for Layer Semiconductor Nanostructures

Published on: December 5, 2015

12.4K

在聚焦离子束纳米制造中减少离子植入

Alexander V Rumyantsev1, Nikolai I Borgardt1, Roman L Volkov1

  • 1National Research University of Electronic Technology - MIET, Bld. 1, Shokin Square, Zelenograd, Moscow, 124498, Russia. lemi@miee.ru.

Nanoscale
|September 1, 2025
PubMed
概括

通过使用边缘研磨工艺提高了聚焦离子束 (FIB) 的纳米制造质量. 与传统的光滑削相比,这种策略显著减少了离子在基板中的植入.

更多相关视频

Focused Ion Beam Fabrication of LiPON-based Solid-state Lithium-ion Nanobatteries for In Situ Testing10:58

Focused Ion Beam Fabrication of LiPON-based Solid-state Lithium-ion Nanobatteries for In Situ Testing

Published on: March 7, 2018

10.3K
Focused Ion Beam Lithography to Etch Nano-architectures into Microelectrodes13:49

Focused Ion Beam Lithography to Etch Nano-architectures into Microelectrodes

Published on: January 19, 2020

6.8K

相关概念视频

Nuclear Overhauser Enhancement (NOE)01:06

Nuclear Overhauser Enhancement (NOE)

Irradiation of a spin-active nucleus causes an increase or decrease in the signal intensity of neighboring nuclei that are not necessarily chemically bonded or involved in J-coupling. This phenomenon, called the nuclear Overhauser enhancement (NOE), results from through-space interactions between the nuclear spins. The NOE effect decreases with increasing internuclear distance and is generally not observed beyond 4 angstroms. In NOE, dipole-dipole interactions between neighboring spin-active...