气空缺导致铁电中的疲劳 Al0.93B0.07NN
Walter J Smith1, Betul Akkopru-Akgun2, Erdem Ozdemir2
1School of Mechanical Engineering and Birck Nanotechnology Center, Purdue University, West Lafayette, Indiana 47907, United States.
ACS nano
|September 15, 2025
概括
铁电化 (Al0.93B0.07N) 存储器设备的耐久性有限. 铁电切换会产生的空缺,可能是由于热原子损伤,从而降低了设备的性能.
科学领域:
- 材料科学 材料科学 材料科学
- 固态物理 固态物理
- 设备物理 设备物理
背景情况:
- 像Al0.93B0.07N这样的氏体铁电材料,由于其较大的残留极化和稳定性,为高温内存应用提供了潜力.
- 目前的Al0.93B0.07N设备对下一代计算架构的耐用寿命不足.
研究的目的:
- 为了确定限制Al0.93B0.07N铁电器件耐久性的特定缺陷.
- 了解铁电切换周期期间的缺陷演变机制.
主要方法:
- 结合电子测量和光学光谱仪来描述缺陷状态.
- 光发光光谱学和正上负下 (PUND) 测量以量化偏振和缺陷过渡.
- 热刺激脱极化电流和模分谱,以进一步分析缺陷行为.
主要成果:
- 在铁电切换过程中识别了接近2.1 eV的新兴光学转换,与非切换偏振相关.
- 观察到,随着循环,这种2.1 eV过渡的强化,表明缺陷状态的增加.
- 将2.1 eV的过渡归因于与更深的带隙缺陷相互作用的空位.
结论:
- 铁电切换在Al0.93B0.07N中产生空缺,可能是通过高切换场的热原子损伤.
- 这种缺陷生成机制是这些铁电记忆器件耐久性有限的主要原因.
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