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Updated: Jan 17, 2026

High-speed Particle Image Velocimetry Near Surfaces
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High-speed Particle Image Velocimetry Near Surfaces

Published on: June 24, 2013

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一次性超快速压缩复杂幅度成像,以皮秒为单位对固体表面演变的成像.

Weiqi Tang, Haocheng Tang, Yaodan Hu

    Optics letters
    |September 16, 2025
    PubMed
    概括

    这项研究引入了一种新的单射超快成像方法. 它捕捉了强度和相位,使得激光诱导材料动态的详细分析成为可能.

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    High-Speed Atomic Force Microscopy Imaging of DNA Three-Point-Star Motif Self Assembly Using Photothermal Off-Resonance Tapping

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    相关概念视频

    Atomic Force Microscopy01:08

    Atomic Force Microscopy

    Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
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