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Updated: Jan 17, 2026

Measurement of X-ray Beam Coherence along Multiple Directions Using 2-D Checkerboard Phase Grating
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通过薄膜干扰,将高分辨率X射线网格的效率提高一倍

D L Voronov, E M Gullikson, F Salmassi

    Optics letters
    |September 16, 2025
    PubMed
    概括

    优化反射涂层厚度大大提高了软X射线格子的效率. 这种薄膜干扰技术几乎使640 eV的高槽密度格子的衍射效率翻了一番.

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