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Updated: Jan 17, 2026

Precision Milling of Carbon Nanotube Forests Using Low Pressure Scanning Electron Microscopy
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Precision Milling of Carbon Nanotube Forests Using Low Pressure Scanning Electron Microscopy

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使用高频脉冲电化学加工对Ag尖顶进行纳米尺度利

Yongkai Xiao1, Wenao Liao2, Honghua Ma1

  • 1Wuhan National Laboratory for Optoelectronics, Huazhong University of Science and Technology, Wuhan, China. shuyiliu@hust.edu.cn.

Nanoscale
|September 19, 2025
PubMed
概括

研究人员开发了使用高频脉冲电化学加工 (EM) 进行光学扫描探针显微镜的更利的银 (Ag) 尖端. 这种先进的制造方法通过提高尖端精度来增强纳米光子学研究.

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相关概念视频

Atomic Force Microscopy01:08

Atomic Force Microscopy

Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
The AFM Probe
The probe is regarded as the heart of any AFM setup and comprises the...
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