使

Yucheng Pan1, Jiasi Chen1, Peiwen Wu1

  • 1College of Electronic Engineering & College of Artificial Intelligence, South China Agricultural University, Guangzhou 510642, China.

Sensors (Basel, Switzerland)
|September 19, 2025
PubMed
概括

这项研究引入了一种新的方法,用于检测轨道表面缺陷,使用偏振图像和增强的DeepLabV3+网络. 该方法在具有挑战性的低光条件下提高了准确性,确保了更安全的工业操作.