在手术期间准间接低区预测了儿科耐药的成功结果

Navaneethakrishna Makaram1, Matthew Pesce1, Melissa Tsuboyama2

  • 1Fetal-Neonatal Neuroimaging and Developmental Science Center, Division of Newborn Medicine, Department of Pediatrics, Boston Children's Hospital, Harvard Medical School, Boston, Massachusetts, USA.

Epilepsia
|September 20, 2025
PubMed
概括

使用内脑电图 (iEEG) 识别大脑中低区,可以准确预测手术后患有耐药性 (DRE) 的儿童的发作结果. 这种方法,即使使用简短的录音,也提高了儿科DRE的手术规划.