基于滑动窗背景估计和图像融合的强大的光学切割方法,用于连续垂直扫描结构化照明显微镜的图像融合

Optics express
|September 23, 2025
PubMed
概括

一种新的光学切割方法改善了复杂表面的连续垂直扫描结构化照明显微镜 (CVS-SIM). 这种技术提高了信号噪声比,并减少了重建错误,从而实现了高质量的表面地形测量.

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