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Updated: Apr 11, 2026

The Generation of Higher-order Laguerre-Gauss Optical Beams for High-precision Interferometry
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Published on: August 12, 2013

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基于分数轨道角动量束干扰仪和简单的图像处理的光学测量系统.

Long Wang, Xiaoli Yin, Yawen Sun

    Optics express
    |September 23, 2025
    PubMed
    概括

    这项研究引入了一种新的分数轨道角动量 (FOAM) 束干扰仪,用于精确的光学测量. 干扰仪准确地以高分辨率测量微运动和速度,简化计算并减少光学传感中的错误.

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    Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
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