半导体异构结构中导电带的直接纳米级映射,采用离轴电子全息学

David Cooper1, Antoine Lombrez1, Eva Monroy2

  • 1Univ. Grenoble Alpes, CEA, LETI, F-38000 Grenoble, France.

Nano letters
|September 25, 2025
PubMed
概括

离轴电子全息直接测量半导体导电带的纳米分辨率. 该技术揭示了接口和设备中的电子景观,克服了以前的实验限制.

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