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网络密度对分子层沉积的圆电子束/EUV电阻的模式性能的影响
Long Viet Than1, Giulio D'Acunto1, Maggy Harake1
1Department of Chemical Engineering, Stanford University, Stanford, California 94305, United States.
ACS applied materials & interfaces
|September 26, 2025
概括
研究人员探索了金属有机光电阻的分子网络结构如何影响极紫外线 (EUV) 光刻性能. 氧化中较低的网络密度阻碍了提高灵敏度和分辨率,实现14纳米半音调模式.
科学领域:
- 材料科学 材料科学 材料科学
- 纳米技术 纳米技术
- 化学工程是化学工程的重要组成部分.
背景情况:
- 极紫外线 (EUV) 光刻法中持续的设备缩放面临着当前光电阻化学品的挑战,包括灵敏度差,蚀刻阻力和图案崩.
- 金属有机光电阻,特别是通过混合分子层沉积 (MLD) 沉积的金属有机光电阻,由于厚度控制,均性和真空处理兼容性的优势,提供了潜在的解决方案.
- 了解混合MLD电阻中分子设计和光刻性能之间的关系对于推进半导体制造至关重要.
研究的目的:
- 调查网络结构,特别是网络密度对氧化物 ("alucone") 负色调光电阻的光刻性能的影响.
- 为了阐明这些混合MLD在电子束光刻 (EBL) 下抵抗的模式机制,并将其与EUV诱导的反应进行比较.
- 为了确定最佳的阻力设计,用于在先进的石版画中高分辨率的图案.
主要方法:
- 一系列具有不同网络密度的氧化光电阻剂的合成和表征.
- 使用电子束光刻 (EBL) 作为EUV光刻的替代品进行模式调查.
- 使用洪水暴露和现场表征技术分析EUV诱导的反应.
主要成果:
- 具有最低网络密度的光电阻表现出优越的灵敏度和分辨率,与更密集的网络电阻相比.
- 使用EBL.成功地解决了14纳米半径的密集线/空间格子.
- 在网络密度和阻力性能之间建立的相关性,为模式机制提供了洞察力.
结论:
- 混合MLD光电阻的网络密度显著影响了它们的光刻性能.
- 在氧化中减少网络密度可以提高灵敏度和分辨率,从而实现更细致的特征图案.
- 这项研究提供了关键的分子设计指南,用于开发下一代EUV光刻画的光电阻.
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