间接校准方法的计量比较纳米印:一个基于引导的方法
Giacomo Maculotti1, Lorenzo Giorio2, Gianfranco Genta1
1Department of Management and Production Engineering, Politecnico di Torino, Corso Duca degli Abruzzi 24, 10129 Turin, Italy.
Materials (Basel, Switzerland)
|September 27, 2025
概括
对比了纳米沉积的间接校准方法,这对于面积形状功能和框架合规性至关重要. 用经过认证的参考材料入对,优化了机械表征的准确性和不确定性.
科学领域:
- 材料科学 材料科学 材料科学
- 计量学 计量学 计量学
- 机械工程 机械工程
背景情况:
- 区域形状函数和框架合规性在纳米缩中至关重要,影响测量准确性和不确定性.
- 根据ISO 14577-2的间接校准方法,由于实用性和速度,被广泛使用.
- 以前缺乏一个全面的计量框架来比较这些方法.
研究的目的:
- 为了比较间接校准方法的性能,纳米缩区域的形状功能和框架合规性.
- 从标准和最新文献中评估不同的校准替代方案.
- 介绍纳米缩数据集对使用引导方法的不确定性估计的影响.
主要方法:
- 间接校准方法对面积形状功能和框架合规性的比较.
- 不确定性估计使用引导估计.
- 来自认证参考材料的纳米印记数据集的分析.
主要成果:
- 用经过认证的参考材料入对,优化了机械表征的准确性和不确定性.
- 通过使用多种认证的参考材料,与单个样本方法相比,可以实现更强大的校准方法.
- 这项研究强调了纳米印数据集对不确定性估计的影响.
结论:
- 纳米缩校准的最佳方法包括对认证的参考材料进行缩.
- 这种方法提高了校准实验条件的稳定性.
- 这些发现有助于为纳米印测量提供更可靠的计量框架.
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