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Updated: Jan 16, 2026

Spectral and Angle-Resolved Magneto-Optical Characterization of Photonic Nanostructures
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Spectral and Angle-Resolved Magneto-Optical Characterization of Photonic Nanostructures

Published on: November 21, 2019

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近场光学显微镜和尖端辅助光发光的相关性

W Pfeiffer1, N S Mueller1,2, R Hillenbrand3,4

  • 1Department of Physics, Freie Universität Berlin, Berlin, Germany.

Journal of microscopy
|September 27, 2025
PubMed
概括

研究人员开发了一种新的相关纳米级光学成像技术,该技术结合了尖端增强光发光 (TEPL) 和散射式扫描近场光学显微镜 (s-SNOM). 这种方法以前所未有的细节揭示了低维材料的局部应变和介电变化.

关键词:
在TAPL中,我们可以看到.在 TMDCDC 中,您可以使用:纳米成像技术的纳米成像摄影光的发光效应s-SNOM 的名称.

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