GeSe,使

Minseok Moon1, Seungwoo Hwang1, Jaesun Kim1

  • 1Department of Materials Science and Engineering and Research Institute of Advanced Materials, Seoul National University, Seoul 08826, Korea.

概括

机器学习潜能准确地模拟无形GeSe,揭示了对Ovonic Threshold Switching (OTS) 存储器设备至关重要的两个缺陷类型. 这些与特定原子结构相关的缺陷解释了非易失性记忆中的切换行为.