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Updated: May 2, 2026

Ohmic Contact Fabrication Using a Focused-ion Beam Technique and Electrical Characterization for Layer Semiconductor Nanostructures
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Ohmic Contact Fabrication Using a Focused-ion Beam Technique and Electrical Characterization for Layer Semiconductor Nanostructures

Published on: December 5, 2015

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在无限层尼基酸盐/SrTiO3接口的巨型光导体通过光学诱导的高流动性电子气体

David Sanchez-Manzano1, G Krieger2, A Raji3,4

  • 1Laboratoire Albert Fert, CNRS, Thales, Université Paris-Saclay, Palaiseau, France. davidsan@ucm.es.

Nature materials
|October 10, 2025
PubMed
概括

研究人员在氧化物接口上光生成了一个二维电子气体 (2DEG),使光学切换在ON和OFF状态之间成为可能. 这一突破为先进的电子提供了巨大的,即时的导电率变化.

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Tuning Oxide Properties by Oxygen Vacancy Control During Growth and Annealing

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相关概念视频

The Electrical Double Layer01:30

The Electrical Double Layer

In the region where two bulk phases meet, an intricate electric charge distribution arises due to charge transfer, ion adsorption, molecular orientation, and charge distortion. This complex distribution is commonly referred to as the electrical double layer.When a solid electrode interfaces with ions in an electrolyte solution, the speed of electron transfer dictates the rates of oxidation and reduction. The electrode acquires a charge through the escape of atoms into the solution as cations or...
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