STEM线

Min-Chul Kang1, Juhong Park1, Cheol-Woong Yang1

  • 1School of Advanced Materials Science and Engineering, Sungkyunkwan University, Suwon 16419, South Korea.

Micron (Oxford, England : 1993)
|October 11, 2025
PubMed
概括

本研究引入了一种新的方法来纠正扫描传输电子显微镜 (STEM) 图像中的扫描漂移,提高了结构和光谱数据的原子尺度分析精度.

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