一个可调节相位的噪声成型SAR ADC,用于减轻PIP电容器的寄生电容效应
Xuelong Ouyang1,2, Hua Kuang1,2, Dalin Kong1,2
1National Key Laboratory of Infrared Detection Technologies, Shanghai Institute of Technical Physics, Chinese Academy of Sciences, Shanghai 200083, China.
Sensors (Basel, Switzerland)
|October 16, 2025
概括
这项研究引入了一种新的相位调节顺序近似注册 (SAR) 模拟到数字转换器 (ADC),以克服寄生式电容限制. 可重新配置的架构提高了成像系统的分辨率和速度.
科学领域:
- 电气工程 电气工程
- 微电子学微电子学
- 模拟电路设计 模拟电路设计
背景情况:
- 在CMOS过程中的多绝缘体多电容器中的寄生电容性限制了成像中的高分辨率SAR ADC性能.
- 这种瓶阻碍了先进的成像系统的发展,需要精确的模拟到数字转换.
研究的目的:
- 提出一个可相调节的SAR ADC,具有可重新配置的架构,以减轻寄生电容效应.
- 为了在SAR ADC中实现高速操作和高分辨率转换之间的权衡.
主要方法:
- 一个新的相调节逻辑单元被设计用于在传统SAR和噪声塑造 (NS) SAR模式之间切换.
- 改进的SAR逻辑单元使可调节的相位插入和核心逻辑区域减少了86%.
- 一个原型是使用0.35-μmCMOS工艺制造的,用于性能评估.
主要成果:
- 在常规模式下,ADC实现了7.69有效位以2MS/s的速度.
- 激活噪声成形模式,将分辨率提高到11.06位 (68.3 dB SNDR),速度为125kS/s.
- 该设计证明有效地抑制了带内量子化噪声.
结论:
- 拟议的相调节SAR ADC架构成功地解决了CMOS过程中的寄生电容限制.
- 这种可重新配置的设计通过平衡速度和精度,为实现高性能ADC提供了实际解决方案.
- 该研究为实现高分辨率成像系统提供了一种可行的方法,尽管非理想的被动组件.
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