相关实验视频

Updated: Jan 14, 2026

Comprehensive Characterization of Extended Defects in Semiconductor Materials by a Scanning Electron Microscope
11:14

Comprehensive Characterization of Extended Defects in Semiconductor Materials by a Scanning Electron Microscope

Published on: May 28, 2016

14.3K

对于晶圆缺陷检查的高效和强大的SEM图像否定.

Hyunwoong Bae1, Jaeseok Byun2, Yongwoo Lee3

  • 1Interdisciplinary Program in Artificial Intelligence, Seoul National University, Gwanak-ro, South Seoul 08826, Korea.

Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada
|October 23, 2025
PubMed
概括

我们开发了Relaxed Noise2Noise with Input dropout (ReNIn) 用于扫描电子显微镜 (SEM) 消除噪声. ReNIn为晶圆缺陷检查提供了高效的培训和改进的泛化.

关键词:
这就是SEM SEM.深度学习是一种深度学习.拒绝使用,拒绝使用.拒绝进行检查.

更多相关视频

Use of Sacrificial Nanoparticles to Remove the Effects of Shot-noise in Contact Holes Fabricated by E-beam Lithography07:47

Use of Sacrificial Nanoparticles to Remove the Effects of Shot-noise in Contact Holes Fabricated by E-beam Lithography

Published on: February 12, 2017

7.5K
Subsurface Defect Localization by Structured Heating Using Laser Projected Photothermal Thermography11:34

Subsurface Defect Localization by Structured Heating Using Laser Projected Photothermal Thermography

Published on: May 15, 2017

11.5K

相关概念视频

Preparation of Samples for Electron Microscopy01:20

Preparation of Samples for Electron Microscopy

To be visualized by an electron microscope, either transmission or scanning, biological samples need to be fixed (stabilized) so the electron beam does not destroy them and dried thoroughly (desiccated/dehydrated) so the vacuum does not affect them. Fixation needs to be done as quickly as possible because the sample properties will start changing as soon as it is removed from its natural environment. For example, in a tissue sample, the oxygen levels begin decreasing, causing an altered...
6.8K