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Updated: Jan 14, 2026

Picometer-Precision Atomic Position Tracking through Electron Microscopy
Published on: July 3, 2021
Bridget R Denzer1, Colin Gilgenbach1, James M LeBeau1
1Department of Materials Science & Engineering, Massachusetts Institute of Technology, Cambridge, MA 02139, USA.
电子影像学 电子影像学 电子影像学
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