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相关概念视频

Inductively Coupled Plasma Atomic Emission Spectroscopy: Instrumentation01:26

Inductively Coupled Plasma Atomic Emission Spectroscopy: Instrumentation

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Inductively coupled plasma (ICP) is the common plasma source used in atomic emission spectroscopy (AES), a technique that detects and analyzes various elements in a sample. This method is often called inductively coupled plasma atomic emission spectroscopy (ICP-AES).
There are three main types of inductively coupled plasma atomic emission spectroscopy  (ICP-AES) instruments: sequential, simultaneous multichannel, and Fourier transform instruments, with the latter being less commonly used....
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Electronic Distance Measuring Instruments01:30

Electronic Distance Measuring Instruments

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Electronic Distance Measuring Instruments (EDMs) are essential tools in modern surveying, offering precise distance measurements by emitting electromagnetic signals and calculating the time required for these signals to travel to a target and return. Two primary types of signals are used in EDMs — light waves and microwaves — each suited to specific environmental and distance requirements. Light-wave-based EDMs utilize either infrared or laser light, providing high accuracy over...
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Atomic Emission Spectroscopy: Overview01:20

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Atomic emission spectroscopy (AES) is an analytical technique used to determine the elemental composition of a sample by analyzing the light emitted from excited atoms. In AES, atoms in a sample are excited to higher energy levels by thermal energy from high-temperature sources, such as plasma, arcs, or sparks. When these excited atoms return to lower energy states, they emit light at specific wavelengths characteristic of each element. The resulting atomic emission spectrum, which consists of...
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Scanning Electron Microscopy01:07

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A scanning electron microscope (SEM) is used to study the surface features of a sample by using an electron beam that scans the sample surface in a two-dimensional manner. Typically, areas between ~1 centimeter to 5 micrometers in width can be imaged. SEM can be used to image bacteria, viruses, tissues as well as larger samples like insects. Conventional SEM gives a magnification ranging from 20X to 30,000X and spatial resolution of 50 to 100 nanometers.
Fundamental Principles
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相关实验视频

Updated: Jan 14, 2026

Quantitative Atomic-Site Analysis of Functional Dopants/Point Defects in Crystalline Materials by Electron-Channeling-Enhanced Microanalysis
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综合并行光束WDS/EDS分析:地质科学研究的好处和局限性

Giancarlo Capitani1, Roberto Conconi1,2, Niccolò Magnani1

  • 1Department of Earth and Environmental Sciences, University of Milano-Bicocca, Piazza della Scienza 4, Milano 20126, Italy.

Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada
|October 27, 2025
PubMed
概括

这项研究将波长分散/能量分散微分析与传统电子微探测器进行比较. 能量分散光谱技术为矿物质提供了更快,更温和的分析,没有峰值重叠.

关键词:
在EDS中使用EDS.电子探测器微分析平行光束 WDS 的平行光束 WDS.

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Synchrotron X-ray Microdiffraction and Fluorescence Imaging of Mineral and Rock Samples
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科学领域:

  • 地质化学 地质化学
  • 材料科学 材料科学 材料科学
  • 分析化学 分析化学

背景情况:

  • 场辐射扫描电子显微镜 (FESEM) 与平行光束波长分散/能量分散 (WDE/EDS) 微分析集成,提供先进的分析能力.
  • 传统的电子微探测器 (EMP) 分析是确定元素组成的成熟技术.

研究的目的:

  • 为了比较一个集成的WDE/EDS微分析系统与传统EMP的性能.
  • 在相似的操作条件下评估每个技术的优点和局限性.

主要方法:

  • 两种分析系统都使用了相同的参考样本.
  • 在进行比较分析时尽可能保持一致的操作参数.
  • 在已知成分的矿物标准上进行元素分析.

主要成果:

  • 集成的WDE/EDS系统产生了内部一致的结果.
  • 对于缺乏光谱重叠的主要元素,波长分散光谱 (WDS) 与能量分散光谱 (EDS) 没有明显的优势.
  • 由于并发的光谱采集和每原子较低的电子剂量,EDS表现出更快,更温和的分析,有利于矿物质分析.
  • 在所有情况下都观察到显著的元素迁移,特别是在单价,大离子半径元素 (K,Na) 中.

结论:

  • 集成的WDE/EDS系统提供可靠的微分析,而EDS在速度和样品保存方面特别有前途.
  • 仔细考虑潜在的元素迁移对于准确的定量分析至关重要,特别是对于元素.
  • 该研究强调了WDS和EDS在微分析应用中的互补性质和特定优势.