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Updated: Jan 13, 2026

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基于改进的YOLOv11的电子产品表面缺陷检测方法

Jianming Meng1, Longjian Guo1, Wei Hao1

  • 1Department of Electronic and Communication Engineering, Shandong College of Electronic Technology, Jinan, China.

PloS one
|October 28, 2025
PubMed
概括

本研究引入了一种改进的YOLOv11模型,用于在电子产品中增强表面缺陷检测. 新方法显著提高了精度和召回率,为制造质量控制提供了更可靠的自动化解决方案.

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