从微/纳米颗粒中通过薄膜嵌提取TEM片加强了FIB方法

Bo Deng1, Li Lei1, Lei Wang2

  • 1Advanced Material Analysis and Test Center, Xi'an University of Technology, Xi'an, Shaanxi 710048, China; School of Materials Science and Engineering, Xi'an University of Technology, Xi'an, Shaanxi 710048, China.

Micron (Oxford, England : 1993)
|October 31, 2025
PubMed
概括

一种新的薄膜嵌入强化聚焦离子束 (FES-FIB) 技术精确地提取了超薄层,用于显微镜. 这种方法克服了传统嵌入的问题,改善了分析微/纳米粒子的样本准备.