在扫描质子束辐射辐射过程中,在X射线平板探测器中对二次辐射背景的描述
Toshiyuki Terunuma1,2, Kenta Takada3, Seishin Takao4
1Institute of Medicine, University of Tsukuba, Ibaraki, Japan.
Medical physics
|November 8, 2025
概括
在质子疗法期间,X射线平面探测器中的二次辐射背景是最小的. 这项研究模拟了它的特征,发现它对质子放射学图像质量的影响很小.
科学领域:
- 医学物理 医学物理
- 放射性成像学成像学
- 辐射检测检测器可以检测到辐射.
背景情况:
- 在扫描质子束辐射过程中,千伏X射线平面探测器 (FPD) 中的二次辐射背景 (BG) 尚不清楚.
- 这种背景可能会影响质量图像质量质子放射和相关的成像技术.
研究的目的:
- 在扫描质子束辐射过程中,在FPD中描述和数学建模二次辐射BG.
- 量化本 BG 对 FPD 图像质量的影响.
主要方法:
- 使用同步子质子系统在各种辐射条件下 (仅X射线,质子辐射,暂停) 采集了FPD图像.
- 分析了FPD图像,根据X射线暴露状态和质子辐射分类.
- 执行蒙特卡洛模拟,以确定二次辐射源.
主要成果:
- 二次辐射BG表现为稀疏的尖峰,影响小于1.25%的像素,空间偏差最小.
- BG强度遵循了一个指数式衰变模型.
- 对平均像素强度变化的影响为<1%,即时光子被确定为主要来源.
结论:
- 在质子束辐射过程中,FPD中的二次辐射BG可以通过定量建模.
- 观察到的BG对FPD图像的平均像素强度的影响很小,这表明它不会显著降低图像质量.
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