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Updated: Jan 11, 2026

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Takumi Ohashi1,2, Tomoyuki Sato1, Taichi Nakajima1

  • 1Graduate School of Science and Technology, Kyoto Institute of Technology Matsugasaki, Sakyo Kyoto 606-8585 Japan.

RSC advances
|November 10, 2025
PubMed
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这项研究纠正了先前发表的一篇文章. 修正涉及到文章的内容.

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Atomic Force Microscopy01:08

Atomic Force Microscopy

Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
The AFM Probe
The probe is regarded as the heart of any AFM setup and comprises the...
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