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Updated: Jan 6, 2026

Quantitative Atomic-Site Analysis of Functional Dopants/Point Defects in Crystalline Materials by Electron-Channeling-Enhanced Microanalysis
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Published on: May 10, 2021

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电子衍射和暗场TEM用于2D范德瓦尔斯材料的结构分析

Byunghyun Kim1, Daesung Park1,2, Siwon Jeong2

  • 1Department of Materials Science and Engineering, Seoul National University, Seoul, 08826, Republic of Korea.

Applied microscopy
|November 11, 2025
PubMed
概括

传输电子显微镜 (TEM) 揭示了二维范德瓦尔斯材料的结构变化. 这些见解将原子结构与材料功能联系起来,这对于开发新的电子和光学设备至关重要.

关键词:
2D 范德瓦尔斯材料材料暗场成像 - 暗场成像电子衍射的电子衍射方式传输电子显微镜的使用

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