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Updated: Jan 11, 2026

Photoelectron Imaging of Anions Illustrated by 310 Nm Detachment of F−
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Published on: July 27, 2018

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对CH2F2的电子冲击研究在广泛的能量范围 (0.1-5000 eV) 上

Smruti Parikh1, Nirali Bhavsar2,3, Sagar Vadhel3

  • 1The Maharaja Sayajirao University of Baroda, Vadodara 390001, India.

The Journal of chemical physics
|November 17, 2025
PubMed
概括

本研究详细介绍了电子与二甲 (CH2F2) 气体在广泛的能量频谱中的相互作用. 它量化了弹性和不弹性过程,为了解其在各种应用中的行为提供了关键数据.

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