Xinlai Xing1, Fei Wen1, Sascha Schäfer2,3

  • 1Center for Ultrafast Science and Technology, School of Chemistry and Chemical Engineering, Zhangjiang Institute for Advanced Study, Shanghai Jiao Tong University, Shanghai 200240, China.

概括

超快速电子显微镜揭示了黑 (BP) 纹中的全球膜振动. 这些与格子扭曲相关的动态为纳米电机系统 (NEMS) 提供了洞察力.