基于YOLO的增强框架,用于准确检测和识别带有明显物体的普通小麦杂质
Hossein Bagherpour1, Negar Fattahi Peyruo2
1Department of Biosystems Engineering, Faculty of Agriculture, Bu-Ali Sina University, Hamedan, Iran. h.bagherpour@basu.ac.ir.
Scientific reports
|November 18, 2025
概括
这项研究评估了用于实时检测小麦杂质的YOLO模型. YOLOv5n为实时应用提供了最佳的速度精度平衡,而较大的YOLO模型适合实验室分析.
科学领域:
- 农业工程 农业工程
- 计算机视觉 计算机视觉
- 食品科学 食品科学 食品科学
背景情况:
- 准确检测小麦谷物杂质对于储存,磨削和收获至关重要.
- 实时检测需要与处理速度平衡精度.
研究的目的:
- 评估YOLOv5n,YOLOv5x,YOLOv8n和YOLOv8x模型用于检测小麦粒杂质的性能.
- 为实验室和实时应用确定最佳算法和分辨率.
主要方法:
- 在700个标记图像上训练了四个YOLO模型 (YOLOv5n,YOLOv5x,YOLOv8n,YOLOv8x) 在三个分辨率上.
- 基于检测准确度 (mAP@50) 和处理速度的评估模型.
主要成果:
- 较大的YOLO模型 (YOLOv5x,YOLOv8x) 在实验室应用中显示出类似的性能,但速度降低.
- YOLOv5n在320x320分辨率下提高了4%的检测速度,同时保持了准确性,非常适合实时使用.
- 对视觉上类似的杂质 (85-88%) 和其他 (>95%) 实现了高mAP@50 .
结论:
- 对于非破坏性小麦杂质检测,YOLO模型是有效的.
- 模型选择取决于应用需求:实时的YOLOv5n,实验室分析的YOLOv5x/YOLOv8x.
- 该方法可以适应在其他谷物中检测杂质.
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