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用扫描电子显微镜和碎形分析对食品表面进行表征:一篇综述

Md Hafizur Rahman Bhuiyan¹, Nushrat Yeasmen¹, Valérie Orsat²

¹Department of Bioresource Engineering, McGill University, 21111 Lakeshore Road, Sainte Anne de Bellevue, H9X3V9 Quebec, Canada; Department of Food Engineering and Technology, Bangladesh Agricultural University, Mymensingh 2202, Bangladesh.

|November 20, 2025

概括

扫描电子显微镜 (SEM) 与碎形分析相结合,提供了一种强大的方法来表征食品表面. 这种方法量化地描述了表面的复杂性,有助于优化食品加工和质量管理.

科学领域:

食品科学与技术食品科学与技术
材料科学材料科学材料科学
图像分析图像分析

背景情况:

表面特征对于食品质量,安全和消费者接受至关重要.
微和纳米尺度的地形特征显著影响食品的特性.
了解表面形态是预测纹理,保持水分和保质期的关键.

研究的目的:

审查扫描电子显微镜 (SEM) 在食品表面地形分析中的应用.
突出碎形分析在量化食品表面复杂性的作用.
探索基于SEM的分形分析与食品质量属性之间的联系.

主要方法:

使用扫描电子显微镜 (SEM) 来捕获食品表面的高分辨率图像.
将碎形和多碎形分析应用于SEM图像的定量表面描述.
与加工参数和质量属性相关联的碎形维度.

主要成果:

SEM与碎形分析相结合,提供了对食品表面粗度,复杂性和异质性的定量测量.
在加工方法 (干燥,,冷) 和碎形尺寸之间发现了积极的相关性.
多分体分析成功地描述了各种食品类型的微观结构异质性.
碎形维度与各种食品的关键质量属性有显著的相互关系.

结论:

基于SEM的碎形分析是深入描述食品表面的有效工具.
这种方法有助于优化食品加工技术,提高质量管理.
这种方法揭示了表面形态和食物属性之间的微妙联系,推进了食品科学和技术.

关键词:

标志性描述标志性描述相对应关系相对应关系碎形法则 (Fractal) 是一个碎形法则.显微镜的使用方法结构结构是一个结构.表面的表面表面的表面

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