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Updated: Jan 10, 2026

Picometer-Precision Atomic Position Tracking through Electron Microscopy
Published on: July 3, 2021
Yan-Wei Chen1,2,3, Meng-Zhe Lian1,2,3, Jin-Jian Han1,2,3
1Hefei National Research Center for Physical Sciences at the Microscale and School of Physical Sciences, University of Science and Technology of China, Hefei 230026, China.
这项研究引入了一种新的双测距方法,用于高达113公里的精确远距离测量. 该技术克服了噪声和传输损失,使得用于诸如卫星形成飞行等应用的精确距离可以实现.
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