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Updated: Jan 10, 2026

Author Spotlight: Introduction to Active Probe Atomic Force Microscopy with Quattro-Parallel Cantilever Arrays
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跨尺度的高带宽原子力显微镜与一个棒滑纳米定位器.

Xiangyuan Wang1, Qi Yu1, Yixuan Meng1

  • 1State Key Laboratory of Mechanical System and Vibration, School of Mechanical Engineering, Shanghai Jiao Tong University, Shanghai, China.

Nature communications
|November 26, 2025
PubMed
概括

一个新的三相控制器使典型的棒滑纳米定位器能够实现高带宽,用于原子力显微镜 (AFM) 的纳米精度扫描. 这一创新扩大了工作范围,并为先进的AFM系统提供了多功能,跨规模的解决方案.

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相关概念视频

Atomic Force Microscopy01:08

Atomic Force Microscopy

Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
The AFM Probe
The probe is regarded as the heart of any AFM setup and comprises the...
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