Unet,.

Mu Lin1, Le Ma2,3, Lisong Dong2,3

  • 1Key Laboratory of Photoelectronic Imaging Technology and System of Ministry of Education of China, School of Optics and Photonics, Beijing Institute of Technology, Beijing 100081, China.

Micromachines
|November 27, 2025
PubMed
概括

这项研究引入了一种新的两阶段Unet框架,用于预测分辨率辅助特征 (SRAF) 参数,提高光刻精度. 该方法通过显著减少图案和边缘放置错误来提高图像保真度.