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Updated: Jan 10, 2026

Characterization of Ultra-fine Grained and Nanocrystalline Materials Using Transmission Kikuchi Diffraction
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应用位置平均收束电子衍射来确定超薄材料的厚度

Johannes Biskupek1, Philipp Eltgen2, Ute Kaiser2

  • 1Electron Microscopy Group of Materials Science, University of Ulm, Ulm D-89081, Germany.

Micron (Oxford, England : 1993)
|November 27, 2025
PubMed
概括

精确的2D材料厚度测量如石墨烯现在可以使用位置平均收束电子衍射 (PACBED). 这种技术通过差值法 (DVM) 或卷积神经网络 (CNN) 进行评估,可以提供准确的,非破坏性的层量化.

关键词:
这就是为什么CBED是CBED.卷积神经网络是一种卷积神经网络.石墨烯是一种石墨烯.二硫酸盐是二硫酸盐的一种.

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相关概念视频

Scanning Electron Microscopy01:07

Scanning Electron Microscopy

A scanning electron microscope (SEM) is used to study the surface features of a sample by using an electron beam that scans the sample surface in a two-dimensional manner. Typically, areas between ~1 centimeter to 5 micrometers in width can be imaged. SEM can be used to image bacteria, viruses, tissues as well as larger samples like insects. Conventional SEM gives a magnification ranging from 20X to 30,000X and spatial resolution of 50 to 100 nanometers.
Fundamental Principles
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