相关实验视频

Updated: May 5, 2026

High-resolution, High-speed, Three-dimensional Video Imaging with Digital Fringe Projection Techniques

High-resolution, High-speed, Three-dimensional Video Imaging with Digital Fringe Projection Techniques

Published on: December 3, 2013

基于自适应边缘的寄生体反射消除,通过相位测量偏移计的多尺度并行单像素成像

Wenjing Chang, Yuankun Liu, Shaotian Zhang

|December 1, 2025

概括

在偏光度光学测试中,使用自适应屏幕显示方法消除了幽灵边缘. 这种技术可以提高光学元件的表面测量精度到微米以下.

科学领域:

光学工程是指光学工程.
计量学计量学计量学

背景情况:

折射计光学测试经常遭受幽灵边缘,这是虚假的信号,降低测量准确度.
这些幽灵边缘来自光学元件前后表面的反射,使分析复杂化.

研究的目的:

引入一种用于自适应性修改屏幕显示的新方法,以消除偏斜度计中的幽灵边缘.
为了提高光学表面测试的准确性和可靠性.

主要方法:

多尺度里埃平行单像素成像 (MS-PSI) 用于精确标记屏幕上的反射区域.
边缘图案被选择性地射到标记区域上,避免整个屏幕以改善前面表面数据采集.
应用经典的空间过来去除中央区域的剩余混合信号.

主要成果:

提出的方法成功地消除了在偏向测量中观察到的幽灵边缘.
使用平面凸和平面凸镜片的实验验证证明了该方法的有效性.
获得的最终表面重建精度处于微米以下的范围内.

结论:

适应性屏幕显示修改提供了一个强大的解决方案,用于在偏向测量中抑制幽灵边缘.
该方法显著提高了光学表面计量学的精度.
这种技术在表征光学元件方面的高准确性得到了验证.

更多相关视频

Compact Lens-less Digital Holographic Microscope for MEMS Inspection and Characterization

Compact Lens-less Digital Holographic Microscope for MEMS Inspection and Characterization

Published on: July 5, 2016

Micro/Nano-scale Strain Distribution Measurement from Sampling Moiré Fringes

Micro/Nano-scale Strain Distribution Measurement from Sampling Moiré Fringes

Published on: May 23, 2017

相关概念视频

Phase Contrast and Differential Interference Contrast Microscopy

Phase Contrast and Differential Interference Contrast Microscopy

Phase-Contrast Microscopes
In-phase-contrast microscopes, interference between light directly passing through a cell and light refracted by cellular components is used to create high-contrast, high-resolution images without staining. It is the oldest and simplest type of microscope that creates an image by altering the wavelengths of light rays passing through the specimen. Altered wavelength paths are created using an annular stop in the condenser. The annular stop produces a hollow cone of...