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Updated: Jan 9, 2026

Ohmic Contact Fabrication Using a Focused-ion Beam Technique and Electrical Characterization for Layer Semiconductor Nanostructures
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对于p型半导体的带混合接触

Cong Wang1,2, Jianmiao Guo1,2, Dexing Liu1,3

  • 1Department of Applied Physics, The Hong Kong Polytechnic University, Hong Kong, China.

Nature nanotechnology
|December 8, 2025
PubMed
概括

研究人员开发了一种新的超薄接口层,用于p型半导体中的低电阻电接触. 这种方法显著降低了像WSe2晶体管这样的设备的接触电阻,为改进的纳米电子铺平了道路.

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